By Anantha Chandrakasan, William J. Bowhill, Frank Fox
Bankruptcy 1 influence of actual expertise on structure / John H. Edmondson three -- half II expertise matters 25 -- bankruptcy 2 CMOS Scaling and concerns in Sub-0.25 [mu]m platforms / Yuan Taur 27 -- bankruptcy three recommendations for Leakage strength relief / Vivek De, Yibin Ye, Ali Keshavarzi, Siva Narendra, James Kao, Dinesh Somasekhar, Raj Nair, Shekhar Borkar forty six -- bankruptcy four Low-Voltage applied sciences / Tadahiro Kuroda, Takayasu Sakurai sixty three -- bankruptcy five Soi expertise and Circuits / Ghavam G. Shahidi, Fari Assaderaghi, Dimitri Antoniadis eighty -- bankruptcy 6 versions of method diversifications in equipment and Interconnect / Duane Boning, Sani Nassif ninety eight -- half III Circuit types for good judgment 117 -- bankruptcy 7 simple common sense households / Kerry Bernstein 119 -- bankruptcy eight matters in Dynamic common sense layout / Paul Gronowski one hundred forty -- bankruptcy nine Self-Timed Pipelines / Ted Williams 158 -- bankruptcy 10 High-Speed VLSI Airthmetic devices: Adders and Multipliers / Vojin G. Oklobdzija 181 -- half IV Clocking 205 -- bankruptcy eleven Clocked garage components / Hamid Partovi 207 -- bankruptcy 12 layout of High-Speed CMOS PLLs and DLLs / John George Maneatis 235 -- bankruptcy thirteen Clock Distribution / Daniel W. Bailey 261 -- half V reminiscence approach layout 283 -- bankruptcy 14 sign in records and Chahes / Ronald Preston 285 -- bankruptcy 15 Embedded Dram / Tadaaki Yamauchi, Michihiro Yamada 309 -- half VI Interconnect and I/O 329 -- bankruptcy sixteen studying on-Chip Interconnect results / Noel Menezes, Lawrence Pileggi 331 -- bankruptcy 17 innovations for using Interconnect / Shannon V. Morton 352 -- bankruptcy 18 I/O and ESD Circuit layout / Stephen C. Thierauf, Warren R. Anderson 377 -- bankruptcy 19 High-Speed electric Signaling / Stefanos Sidiropoulos, Chih-Kong Ken Yang, Mark Horowitz 397 -- half VII Reliability 427 -- bankruptcy 20 Electromigration Reliability / J. Joseph Clement 429 -- bankruptcy 21 scorching provider Reliability / Kaizad Mistry 449 -- half VIII Cad instruments and try out 467 -- bankruptcy 22 evaluate of Computer-Aided layout instruments / Yao-Tsung Yen 469 -- bankruptcy 23 Timing Verification / Victor Peng 480 -- bankruptcy 24 layout and research of energy Distribution Networks / David Blaauw, Rajendran Panda, Rajat Chaudhry 499 -- bankruptcy 25 trying out of High-Performance Processors / Dilip ok. Bhavsar 523
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The parameters are specified in the panel (a) top, see also in text. 36) is the transmission probability. , |μ t/s − ε a | Γ st and R(ε ) −1 , the negative elastic correction I el( 2) becomes two times larger than the positive inelastic correction I in( 2) . To understand the decrease of the conductance for lowtransmission systems on resonance, it is necessary to argue that the elastic part of the conductance decreases more than the increase from the inelastic part. Since the energy is close to the resonance, electrons scattered out from this energy will broaden the resonance giving a large decrease in the elastic conductance.
S. Tautz, Adsorption structure and scanning tunneling data of a prototype organic-inorganic interface: PTCDA on Ag(111), Phys. Rev. B 76, 115421-16 (2007). H. Yamane, S. Kera, K. K. Okudaira, D. Yoshimura, K. Seki and N. Ueno, Intermolecular energy-band dispersion in PTCDA multilayers, Phys. Rev. B 68, 033102 (2003). Copyright © 2011 by Pan Stanford Publishing Pte. Ltd. References 72. 73. 74. 75. 76. 77. 78. 79. 80. 81. 82. 83. 84. 85. 86. 87. 88. 89. 90. 91. Y. Zou, L. Kilian, A. Schöll, T. Schmidt, R.
89. 90. 91. Y. Zou, L. Kilian, A. Schöll, T. Schmidt, R. Fink and E. Umbach, Chemical bonding of PTCDA on Ag surfaces and the formation of interface states, Surf. Sci. 600, 1240–1251 (2006). F. Reinert, G. Nicolay, S. Schmidt, D. Ehm and S. Hüfner, Direct measurements of the L-gap surface states on the (111) face of noble metals by photoelectron spectroscopy, Phys. Rev. B 63, 115415 (2001). V. M. Silkin, J. Zhao, F. Guinea, E. V. Chulkov, P. M. Echenique and H. Petek, Image potential states in graphene Phys.