Design of high-performance microprocessor circuits by Anantha Chandrakasan, William J. Bowhill, Frank Fox

By Anantha Chandrakasan, William J. Bowhill, Frank Fox

Bankruptcy 1 influence of actual expertise on structure / John H. Edmondson three -- half II expertise matters 25 -- bankruptcy 2 CMOS Scaling and concerns in Sub-0.25 [mu]m platforms / Yuan Taur 27 -- bankruptcy three recommendations for Leakage strength relief / Vivek De, Yibin Ye, Ali Keshavarzi, Siva Narendra, James Kao, Dinesh Somasekhar, Raj Nair, Shekhar Borkar forty six -- bankruptcy four Low-Voltage applied sciences / Tadahiro Kuroda, Takayasu Sakurai sixty three -- bankruptcy five Soi expertise and Circuits / Ghavam G. Shahidi, Fari Assaderaghi, Dimitri Antoniadis eighty -- bankruptcy 6 versions of method diversifications in equipment and Interconnect / Duane Boning, Sani Nassif ninety eight -- half III Circuit types for good judgment 117 -- bankruptcy 7 simple common sense households / Kerry Bernstein 119 -- bankruptcy eight matters in Dynamic common sense layout / Paul Gronowski one hundred forty -- bankruptcy nine Self-Timed Pipelines / Ted Williams 158 -- bankruptcy 10 High-Speed VLSI Airthmetic devices: Adders and Multipliers / Vojin G. Oklobdzija 181 -- half IV Clocking 205 -- bankruptcy eleven Clocked garage components / Hamid Partovi 207 -- bankruptcy 12 layout of High-Speed CMOS PLLs and DLLs / John George Maneatis 235 -- bankruptcy thirteen Clock Distribution / Daniel W. Bailey 261 -- half V reminiscence approach layout 283 -- bankruptcy 14 sign in records and Chahes / Ronald Preston 285 -- bankruptcy 15 Embedded Dram / Tadaaki Yamauchi, Michihiro Yamada 309 -- half VI Interconnect and I/O 329 -- bankruptcy sixteen studying on-Chip Interconnect results / Noel Menezes, Lawrence Pileggi 331 -- bankruptcy 17 innovations for using Interconnect / Shannon V. Morton 352 -- bankruptcy 18 I/O and ESD Circuit layout / Stephen C. Thierauf, Warren R. Anderson 377 -- bankruptcy 19 High-Speed electric Signaling / Stefanos Sidiropoulos, Chih-Kong Ken Yang, Mark Horowitz 397 -- half VII Reliability 427 -- bankruptcy 20 Electromigration Reliability / J. Joseph Clement 429 -- bankruptcy 21 scorching provider Reliability / Kaizad Mistry 449 -- half VIII Cad instruments and try out 467 -- bankruptcy 22 evaluate of Computer-Aided layout instruments / Yao-Tsung Yen 469 -- bankruptcy 23 Timing Verification / Victor Peng 480 -- bankruptcy 24 layout and research of energy Distribution Networks / David Blaauw, Rajendran Panda, Rajat Chaudhry 499 -- bankruptcy 25 trying out of High-Performance Processors / Dilip ok. Bhavsar 523

Show description

Read or Download Design of high-performance microprocessor circuits PDF

Similar semiconductors books

Concepts in Spin Electronics

These days details expertise relies on semiconductor and feromagnetic fabrics. info processing and computation are in accordance with electron cost in semiconductor transistors and built-in circuits, and data is saved on magnetic high-density not easy disks in keeping with the physics of the electron spins.

Printed Circuits Handbook

Руководство по печатным платамThe up to date revealed Circuits guide will give you: Unsurpassed counsel on revealed circuits from layout to production. Over 500 illustrations, charts, and tables for speedy entry to crucial info. New to this variation: New insurance of lead-free PCB layout and production innovations, lead-free fabrics, lead-free reliability versions, most sensible practices for top Density Interconnect (HDI), and versatile published circuits.

Latchup in CMOS Technology: The Problem and Its Cure

Why a ebook on Iatchup? Latchup has been, and remains to be, a in all likelihood critical CMOS reliability crisis. This crisis is changing into extra frequent with the ascendency of CMOS because the dominant VLSI expertise, quite as parasitic bipolar features proceed to enhance at ever smaller dimensions on silicon wafers with ever reduce illness densities.

Glancing Angle Deposition of Thin Films: Engineering the Nanoscale

This e-book presents a hugely useful remedy of completely satisfied expertise, collecting current approaches, methodologies, and experimental designs right into a unmarried, cohesive quantity as a way to be precious either as a prepared reference for these within the box and as a definitive consultant for these coming into it. It covers:History and improvement of joyful techniquesProperties and Characterization of joyful fabricated filmsDesign and engineering of optical happy motion pictures together with fabrication and testingPost-deposition processing and integrationDeposition structures for pleased fabricationAlso features a patent survey of appropriate literature and a survey of GLAD’s wide variety of fabric homes and various functions.

Extra resources for Design of high-performance microprocessor circuits

Example text

The parameters are specified in the panel (a) top, see also in text. 36) is the transmission probability. , |μ t/s − ε a | Γ st and R(ε ) −1 , the negative elastic correction I el( 2) becomes two times larger than the positive inelastic correction I in( 2) . To understand the decrease of the conductance for lowtransmission systems on resonance, it is necessary to argue that the elastic part of the conductance decreases more than the increase from the inelastic part. Since the energy is close to the resonance, electrons scattered out from this energy will broaden the resonance giving a large decrease in the elastic conductance.

S. Tautz, Adsorption structure and scanning tunneling data of a prototype organic-inorganic interface: PTCDA on Ag(111), Phys. Rev. B 76, 115421-16 (2007). H. Yamane, S. Kera, K. K. Okudaira, D. Yoshimura, K. Seki and N. Ueno, Intermolecular energy-band dispersion in PTCDA multilayers, Phys. Rev. B 68, 033102 (2003). Copyright © 2011 by Pan Stanford Publishing Pte. Ltd. References 72. 73. 74. 75. 76. 77. 78. 79. 80. 81. 82. 83. 84. 85. 86. 87. 88. 89. 90. 91. Y. Zou, L. Kilian, A. Schöll, T. Schmidt, R.

89. 90. 91. Y. Zou, L. Kilian, A. Schöll, T. Schmidt, R. Fink and E. Umbach, Chemical bonding of PTCDA on Ag surfaces and the formation of interface states, Surf. Sci. 600, 1240–1251 (2006). F. Reinert, G. Nicolay, S. Schmidt, D. Ehm and S. Hüfner, Direct measurements of the L-gap surface states on the (111) face of noble metals by photoelectron spectroscopy, Phys. Rev. B 63, 115415 (2001). V. M. Silkin, J. Zhao, F. Guinea, E. V. Chulkov, P. M. Echenique and H. Petek, Image potential states in graphene Phys.

Download PDF sample

Rated 4.32 of 5 – based on 7 votes